Preparation of Zinc Oxide Thin Film by Plasma Sputtering Method and Study of Changes in its Electrical, Structural and Morphological Properties with Different Doses of Gamma Radiation

Document Type : Original Article

Authors

• S. Nobakht ¹
• R. Talebzadeh ¹
• S. Sobhanian ²
• H. Naghshara ²
• M. Kouhi ²

¹ Department of Physics, Tabriz Branch, Islamic Azad University, Tabriz, Iran

² Faculty of Physics, University of Tabriz, Tabriz, Iran

20.1001.1.20086156.1401.14.51.4.1

---

References

• J. Chen, F.Y. Hung, S.J. Chang, S.J. Young, Journal of Alloys and Compounds, 479, 2009, 674.
• R. Khan, M.S. Khan, M. Zulfequar, M.S. Khan, Materials Science and Applications, 2, 2011, 340.
• Lee, S.S. Lee, J.J. Choi, J. Jeon, K. Ro, Microsystem Technologies, 11, 2005, 416.
• Li, Y. Bando, D. Golberg, Applied Physics Letters, 84, 2004, 3603.
• Majumdar, P. Banerji, Journal of Applied Physics, 107, 2010, 063702.
• Salaoru, P. Buffat, D. Laub, A. Amariei, N. Apetroaei, M. Rusu, Journal of Optoelectronics and Advanced Materials, 8, 2006, 936.
• Tsukazaki, A. Ohtomo, T. Onuma, M. Ohtani, T. Makino, M. Sumiya, Nature Materials, 4, 2005, 42.
• Arshak, O. Korostynska, IEEE Sensors Journal, 3, 2003, 717.
• Arshak, O. Korostynska, Sensor Review,15, 2003, 1.
• Colby, G. Lum, T. Plettner, J. Spencer, IEEE Transactions on Nuclear Science, 49, 2002, 2857.
• Molenberghs, K. Arshak, O. Korostynska, Sensor Review, 25, 2006, 1.
• Arshak, O. Korostynska, Materials Science and Engineering: B, 133, 2006, 1.
• Ibrahim, L. Soliman, Radiation Physics and Chemistry, 53, 1998, 469.
• Arshak, O. Korostynska, Sensors, 2, 2002, 347.
• Maity, S. Sharma, Bulletin of Materials Science, 31, 2008, 841.
• Maity, S. Sharma, Effects of gamma irradiation on electrical, optical and structural properties of tellurium dioxide thin films, 2011.
• Senthil-Srinivasan, M. Patra, V. Choudhary, A. Pandya, Journal of optoelectronics and Advanced Materials, 9, 2007, 3725.
• Sharma, T. Maity, Bulletin of Materials Science, 34, 2011, 61.
• Babu, K. Mohanraj, S. Chandrasekar, N. Senthil Kumar, B. Mohanbabu, Nanoscale Reports, 1, 2018, 26.
• Yang, S. Rossnagel, J. Joo, Vacuum, 86, 2012, 1452.
• Sengupta, R. Sahoo, C. Mukherjee, Materials Letters, 83, 2012, 84.
• Wang, M. Wu, Y. Wang, Y. Yu, X. Wu, L. Zhuge, Vacuum, 89, 2013, 127.
• Aldawood, M. AlGarawi, M.A. Shar, S.M. Ali, Journal of King Saud University-Science, 32, 2020, 2629.
• A. Kakil, B.N. Sabr, L.S. Hana, T.A.H. Abbas, S.Y. Hussin, Journal of the Korean Physical Society, 72, 2018, 561.
• H. Lee, K. Oh, K. Jung, K. Wilson, M.J. Lee, Metals, 10, 2020, 437.
• Alyamani, N. Mustapha, T. Alkhuraiji, H. Idriss, Journal of Ovonic Research, 15, 2019, 301.
• Qindeel, Results in Physics, 7, 2017, 807.
• P. Dabruck. Prototype Moderator at the AKR-2 Training Reactor, Target Station Optimization for the High- Brilliance Neutron Source HBS, Springer; 2018, 127-45.
• Erramli, J. El Asri, Gamma Rays: Applications in Environmental Gamma Dosimetry and Determination Samples Gamma-Activities Induced by Neutrons, Use of Gamma Radiation Techniques in Peaceful Applications, 2019;109.
• Anandh, A.S. Ganesh, R. Thangarasu, R. Sakthivel, R. Kannusamy, K. Tamilselvan, Oriental Journal of Chemistry, 34, 2018, 1619.
• N.H. Mia, M.F. Pervez, M.K. Hossain, M.R. Rahman, M.J. Uddin, Results in Physics, 7, 2017, 2683.S. Nobakht, R. Talebzadeh, S. Sobhanian, H. Naghshara, M. Kouhi, Journal of Materials Science: Materials in Electronics, 15, 2021, 1.